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Vertically aligned carbon nanotube (CNT) arrays are promising candidates for advanced thermal interface materials (TIMs) since they possess high mechanical compliance and high intrinsic thermal conductivity. However, the overall thermal performance of CNT arrays often falls short of expectations when used as TIMs, and the underlying reasons have yet to be fully understood. In this work, the volume fraction of CNT arrays is demonstrated to be the key factor in determining the CNT array thermal transport properties. By increasing the array volume fraction, both the CNT array effective thermal conductivity and the CNT array-glass thermal contact conductance were experimentally found to increase monotonically. One interesting phenomenon is that the increasing rate of thermal conductivity is larger than that of array volume fraction. Compressive experiments verified that the CNT arrays with lower volume fractions suffer from severe buckling, which results in a further decreasing trend. By understanding the underlying reasons behind this trend, the overall thermal performance of vertically aligned CNT arrays can be further increased. [ABSTRACT FROM AUTHOR]

Fiber aligned frequency domain thermoreflectance (FAFDTR) is a simple noncontact optical technique for accurately measuring the thermal conductivity of thin films and bulk samples for a wide range of materials, including electrically conducting samples. FAFDTR is a single-sided measurement that requires minimal sample preparation and no microfabrication. Like existing thermoreflectance techniques, a modulated pump laser heats the sample surface, and a probe laser monitors the resultant thermal wave via the temperature dependent reflectance of the surface. Via the use of inexpensive fiber coupled diode lasers and common mode rejection, FAFDTR addresses three challenges of existing optical methods: complexity in setup, uncertainty in pump-probe alignment, and noise in the probe laser. FAFDTR was validated for thermal conductivities spanning three orders of magnitude (0.1-100 W/m K), and thin film thermal conductances greater than 10 W/m² K. Uncertainties of 10-15% were typical, and were dominated by uncertainties in the laser spot size. A parametric study of sensitivity for thin film samples shows that high thermal conductivity contrast between film and substrate is essential for making accurate measurements. [ABSTRACT FROM AUTHOR]