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This article presents information on the 2005 International Microwave Symposium to be held in Long Beach, California in June 11, 2005. There are nine hotels with convention rates. Five of these are downtown within walking distance of the convention center. There are six guest program tours for either full or half days plus a golf tournament on June 17, 2005. All of the tour busses load at the entrance of the Hyatt Hotel. This year there will be 344 papers presented in seven parallel regular IMS sessions plus an additional 149 papers presented in the open forum format. There will be 160 papers presented in tbe RFIC sessions.

The object of this paper is to outline the present state of art in the high power microwave field with special emphasis on linear beam circuits interacting with periodically loaded waveguides. A number of interaction circuits are discussed, both for "O" and "M" type tubes and areas of advances and future trends are indicated. [ABSTRACT FROM AUTHOR]

Microwave Week included the MTT-S international Microwave Symposium and Exhibition, as well as the 2004 IEEE Radio Frequency Integrated Circuit Symposium. Robert L. Leheny of DARPA and Michael J. Marcus of the Federal Communications Commission appropriately launched IMS 2004 with inspiring plenary speeches. They are to be congratulated on assembling a very talented technical program committee and presenting an unusually comprehensive and informative program. In addition, there were 141-student papers presented always one of the highlights of Microwave Week.

Presents information on the 2003 IEEE MTT-S International Microwave Symposium held from June 18 through 13, 2003 in Philadelphia, Pennsylvania. Number of research papers received for the symposium; Social events of the symposium; Details of the exhibition also held during the symposium.

The article discusses various papers published within the issue, including one by Ted Saad about his experiences on the 1967 IMS Boston conference, another by Richard Mumford on an interview with 2009 IMS Plenary Speaker Peterri Alinikula, and one by Gayle Collins on the PA papers being delivered at IMS and their potential effects on the field.

The article discusses the forthcoming 2008 Institute of Electrical and Electronics Engineers/Microwave Theory and Techniques Society (IEEE/MTT-S) International Microwave Symposium (IMS) to be held in Atlanta, Georgia from June 15 to 20, 2008. The event will include a student paper competition as well as three design competitions which is conducted by 240 reviewers on the Technical Program committee for the interactive forums. The event has historically been the premier opportunity to observe and showcase the latest technology while networking with other attendees. Organizers also rearranged the schedules of the regular sessions to allow the IMS attendees to have more flexibility to attend the sessions on radio frequency integrated circuit (RFIC).

A calendar of business events related to electronic industry worldwide for September 2010 is presented including the Call for Papers Microwave Update (MUD) on August 31, the IEEE Great Lakes Technology Symposium in Ann Arbor, Michigan, and the Antenna Application Symposium in Monticello, Illinois.

The article presents a reprint of "Editorial," by Ted Saad, which appeared in the September/October 1958 issue of the periodical "Microwave Journal." It states the important policy which is to strive for balance of content without diluting the quality of the magazine. It shows that most of the reader response in the field of specialization indicated a desire for papers on antennas including Ferrites, Solid State, and microwave tubes.

This article presents information on the 2005 International Microwave Symposium to be held in Long Beach, California in June 11, 2005. This year's technical program has more than 70 sessions, 37 workshops and seven panels. There will be 493 technical presentations, spread out over three days. This year there will not be a paper copy of the digest, there will only be a CD-ROM. It will be possible to order a soft bound copy from the IEEE Conference Publication Program; details will be available on-site.