Schichler, U., Koltunowicz, W., Endo, F., Feser, K., Giboulet, A., Girodet, A., Hama, H., Hampton, B., Kranz, H.-G., Lopez-Roldan, J., Lundgaard, L., Meijer, S., Neumann, C., Okabe, S., Pearson, J., Pietsch, R., Riechert, U., and Tenbohlen, S.
The paper, prepared by CIGRE WG D1.03 (TF 09), presents the guidelines for risk assessment procedure on defects in GIS based on PD diagnostics. The procedure, described in detail in CIGRE Technical Brochure 525, starts with sensitive PD measurement to detect the critical defects and follows with identification of the type of the defect and its location inside the GIS. This information taken together with other essential data from laboratory measurements, manufacturer's experience, design aspects and trend analysis of the PD activity, are the base for the estimation of the criticality of the defects. Finally, the risk assessment is performed based on the estimated dielectric failure probability and failure consequences that can be different in case of on-site testing or in service activity. [ABSTRACT FROM PUBLISHER]