1. A CLASS OF SEQUENTIAL TESTS FOR AN EXPONENTIAL PARAMETER.
- Author
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Hoel, D. G. and Mazumdar, M.
- Subjects
- *
STATISTICAL sampling , *BAYESIAN analysis , *POPULATION , *BERNOULLI numbers , *STATISTICS , *PROBLEM solving , *METHODOLOGY , *RESEARCH - Abstract
Weiss [5] and Freeman and Weiss [2] have shown how to construct sampling plans which at least approximately minimize the maximum expected sample size in the case of Bernoulli and Normal populations. In this paper we construct sequential procedures of this type for the testing of an exponential parameter. An invariance property of the stepping region is presented which simplifies the construction of the Bayes regions. Several sampling plans are given and some of their properties are obtained, [ABSTRACT FROM AUTHOR]
- Published
- 1969
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