1. Local Scanning Probe Polymerizationof an OrganicMonolayer Covalently Grafted on Silicon.
- Author
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Lee, Joon Sung, Chi, Young Shik, Choi, Insung S., and Kim, Jinhee
- Subjects
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POLYMERIZATION , *SCANNING probe microscopy , *MONOMOLECULAR films , *SILICON , *SURFACES (Technology) , *OLIGOMERIZATION , *ATOMIC force microscopy - Abstract
The possibility of lateral extension of conjugation withina covalentlygrafted molecular layer by a scanning probe-based method was tested.A molecular layer derived from ω-(N-pyrrolyl)propanolwas formed on n-type Si(111) surface. Application of large samplebiases greater than ±4 V during conductive atomic force microscope(AFM) scans under vacuum resulted in changes of mechanical and electricalcharacteristics of the molecular layer: the tip–sample conductancewas increased greatly, the friction was reduced significantly, andthe surface potential of the scanned area was increased. The reductionin friction could be attributed to molecular linking formed withinthe layer. The increased conductance suggested extended conjugationamong the pyrrolyl end groups. Therefore, it was inferred that thebiased AFM scan successfully induced local polymerization/oligomerizationwithin the covalently grafted molecular layer. [ABSTRACT FROM AUTHOR]
- Published
- 2012
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