1. High-performance 4H-SiC-based p-i-n ultraviolet photodiode and investigation of its capacitance characteristics.
- Author
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Cai, Jiafa, Chen, Xiaping, Hong, Rongdun, Yang, Weifeng, and Wu, Zhengyun
- Subjects
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SILICON carbide , *ULTRAVIOLET photolysis , *PHOTODIODES , *ELECTRIC capacity , *WAVELENGTHS , *ULTRAVIOLET detectors - Abstract
We report on high-performance 4H-SiC-based p-i-n ultraviolet (UV) photodiodes and investigation of the capacitance characteristics. The fabricated p-i-n photodiode exhibits a large UV-to-visible rejection ratio ( R 266 nm / R 380 nm ) while displaying a low dark current and a high responsivity at room temperature. Interestingly, even at 450 k, the photodiode presents a high responsivity of 0.15 A/W and high UV-to-visible rejection ratio more than 200. Capacitance-voltage measurements reveal that the 4H-SiC p-i-n photodiode presents strong frequency-, temperature-, and wavelength-dependent capacitance properties. These results indicate that the advances on the 4H-SiC material and the p-i-n junction offer exciting opportunities for important UV detection in a variety of commercial and military fields. [ABSTRACT FROM AUTHOR]
- Published
- 2014
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