1. Power-law scaling regimes for solid-state dewetting of thin films.
- Author
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Zucker, Rachel V., Carter, W. Craig, and Thompson, Carl V.
- Subjects
- *
SOLID state chemistry , *SCALING laws (Nuclear physics) , *WETTING , *THIN films , *COMPUTER simulation , *SURFACE energy - Abstract
The capillary force drives the edges of solid thin films to retract. The distance a film edge has retracted over time is usually fitted to a power law. However, experiments and numerical simulations suggest that edge retraction does not follow a power-law. In this work, a simple geometric model for edge retraction is presented that reproduces the retraction distance versus time scalings of simulations for both isotropic and highly-anisotropic films, and is consistent with experiments. The earliest time at which a power-law fit becomes a reasonable approximation is calculated as a function of substrate–film contact angle. [ABSTRACT FROM AUTHOR]
- Published
- 2016
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