1. Cylindrically bent Laue analyzer in an X‐ray Raman/emission spectrometer: performance tests and a comparison with spherically bent Bragg analyzers.
- Author
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Hiraoka, Nozomu
- Subjects
- *
TRANSITION metal compounds , *ELASTIC scattering , *EMISSION spectroscopy , *SPECTROMETERS , *PHOTONS - Abstract
The performances of a spherically bent Bragg analyzer and a cylindrically bent Laue analyzer in an X‐ray Raman/emission spectrometer are compared. The reflectivity and energy resolution are evaluated from the intensity of the elastic scattering and the width of the energy distribution on a SiO2 glass sample. Widely used, Bragg analyzers display excellent performance at the photon energy
E ≤ 10 keV. However, at higherE , the reflectivity and the resolution gradually deteriorate asE increases, showing poor performance above 20 keV. On the other hand, the reflectivity of the Laue analyzer gradually increases atE > 10 keV, displaying excellent reflectivity and good resolution around 20 keV. The Laue analyzer is suitable for X‐ray absorption spectroscopy in high‐energy‐resolution fluorescence‐detection mode or X‐ray emission spectroscopy on 4d transition metal compounds. Furthermore, the X‐ray Raman features of the lithiumK ‐edge in LiF and the oxygenK ‐edge feature in H2O, measured by nine Bragg analyzers (2 m radius) atE ≃ 9.9 keV and by five Laue analyzers (1.4 m radius) atE ≃ 19.5 keV, have been compared. Similar count rates and resolutions are observed. [ABSTRACT FROM AUTHOR]- Published
- 2024
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