1. Signature of a highly spin polarized resonance state at Co2MnSi(0 0 1)/Ag(0 0 1) interfaces.
- Author
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Christian Lidig, Jan Minár, Jürgen Braun, Hubert Ebert, Andrei Gloskovskii, Alexander Kronenberg, Mathias Kläui, and Martin Jourdan
- Subjects
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THIN films testing , *SPINTRONICS , *PHOTOELECTRON spectroscopy , *HEUSLER alloys , *ELECTRONIC band structure - Abstract
We investigated interfaces of halfmetallic Co2MnSi(1 0 0) Heusler thin films with Ag(1 0 0), Cr(1 0 0), Cu and Al layers relevant for spin valves by high energy x-ray photoemission spectroscopy (HAXPES). Experiments on Co2MnSi samples with an Ag(1 0 0) interface showed a characteristic spectral shoulder feature close to the Fermi edge, which is strongly diminished or suppressed at Co2MnSi (1 0 0) interfaces with the other metallic layers. This feature is found to be directly related to the Co2MnSi(1 0 0) layer, as reflected by control experiments with reference non-magnetic films, i.e. without the Heusler layer. By comparison with HAXPES calculations, the shoulder feature is identified as originating from an interface state related to a highly spin polarized surface resonance of Co2MnSi (1 0 0). [ABSTRACT FROM AUTHOR]
- Published
- 2018
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