1. Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry.
- Author
-
Young Yong Kim, Khubbutdinov, Ruslan, Carnis, Jerome, Sangsoo Kim, Daewoong Nam, Inhyuk Nam, Gyujin Kim, Chi Hyun Shim, Haeryong Yang, Myunghoon Cho, Chang-Ki Min, Changbum Kim, Heung-Sik Kang, and Vartanyants, Ivan A.
- Subjects
- *
INTERFEROMETRY , *RADIATION , *STATISTICS , *PARTICLE beam bunching , *MONOCHROMATORS , *HARD X-rays , *OPTICAL coherence tomography - Abstract
A Hanbury Brown and Twiss interferometry experiment based on second-order correlations was performed at the PAL-XFEL facility. The statistical properties of the X-ray radiation were studied within this experiment. Measurements were performed at the NCI beamline at 10 keV photon energy under various operation conditions: self-amplified spontaneous emission (SASE), SASE with a monochromator, and self-seeding regimes at 120 pC, 180 pC and 200 pC electron bunch charge. Statistical analysis showed short average pulse duration from 6 fs to 9 fs depending on the operational conditions. A high spatial degree of coherence of about 70-80% was determined in the spatial domain for the SASE beams with the monochromator and self-seeding regime of operation. The obtained values describe the statistical properties of the beams generated at the PAL-XFEL facility. [ABSTRACT FROM AUTHOR]
- Published
- 2022
- Full Text
- View/download PDF