1. Effects of KF and RbF treatments on Cu(In,Ga)Se2-based solar cells: A combined photoelectron spectroscopy and DFT study.
- Author
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Majumdar, I., Sahoo, S.K., Parvan, V., Mirhosseini, H., Chacko, B., Wang, Y., Greiner, D., Kühne, T.D., Schlatmann, R., and Lauermann, I.
- Subjects
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PHOTOELECTRON spectroscopy , *SOLAR cells , *ALKALI metals , *METAL defects , *VALENCE bands , *OPEN-circuit voltage , *X-ray photoelectron spectroscopy - Abstract
• Hard X-ray photoelectron spectroscopy, density functional theory studies combined. • In-O, In-F and Ga-F formation on Cu(In,Ga)Se 2 surfaces with KF and RbF treatments. • Greater S-Se intermixing at the interface of KF-treated Cu(In,Ga)Se 2 with CdS. • Alkali metal defects at absorber/buffer interface influence fill factor of devices. • Valence band shifts due to alkali treatment increase interfacial type-inversion. In this work, the alkali-induced chemical and electronic modifications observed at the KF- and RbF-treated Cu(In,Ga)Se 2 (CIGSe)/CdS interfaces are correlated to a Density Functional Theoretical (DFT) model of the alkali metal induced point defects at a CuInSe 2 /CdS interface. Analysed with hard X-ray photoelectron spectroscopy (HAXPES), the near-interface regions showed a Cu-poor, In-rich and stoichiometric CdS composition for the KF-CIGSe/CdS interface and a Cu-poor, In, S-rich composition for the RbF-CIGSe/CdS interface. The DFT-calculated defect formation energies and valence band offsets (VBO) at the defect-induced interfaces indicate towards possible formation of specific defects at the KF- and RbF-treated CIGSe/CdS interfaces. Cu vacancies indicated by the Cu-poor stoichiometry of the alkali-treated interfaces contribute to an increase in the acceptor densities (N A). Possible formation of K Cu and Rb Cu defects could result in lower N A at the interfaces because of the Cu vacancies being filled up by K and Rb atoms. Na Cd and excess Cd Cu defects at the KF-CIGSe/CdS interface and only Cd Cu defects at the RbF-CIGSe/CdS interface might have formed that would result in higher donor densities (N D) at the interfaces. These factors, which showed enhanced type-inversion when applied in device simulations, resulted in fill factor (FF) and open-circuit voltage (V oc) gains in devices. [ABSTRACT FROM AUTHOR]
- Published
- 2021
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