1. Role of impurities in gamma-ray induced luminescence from GaP single crystal.
- Author
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Nakamura, Toshihiro, Nishimura, Tomoaki, Kuriyama, Kazuo, Nakamura, Tohru, and Kinomura, Atsushi
- Subjects
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GAMMA rays , *EMISSION spectroscopy , *SINGLE crystals , *LUMINESCENCE , *GALLIUM phosphide - Abstract
Gamma-ray-induced luminescence is observed from impurity-doped gallium phosphide (GaP) single crystal wafer at room temperature. The luminescence properties are studied for the undoped and impurity-doped GaP wafer samples. These GaP wafers are irradiated with gamma-rays of 1.17 and 1.33 MeV from a cobalt-60 source. In the gamma-ray irradiation of impurity-doped GaP wafers, a luminescence band peaked at approximately 850 nm is appeared in the spectrum at approximately 750–1000 nm. While for the undoped wafer, the gamma-ray-induced luminescence is not observed, indicating that the origin of the luminescence is attributed to the transition between the impurity levels. The broad emission of the impurity-doped GaP is attributed to the pair emission between the deep O-donor at the P site and the deep Si-acceptor at the P site. The emission intensity does not increase proportionally like the gamma ray induced emission of a GaN single crystal wafer observed in our previous study (Appl. Phys. Lett. 118 (2021) 032106). [ABSTRACT FROM AUTHOR] more...
- Published
- 2024
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