1. Accurate surface profile measurement using CMM without estimating tip correction vectors.
- Author
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Watanabe, M., Sato, O., Matsuzaki, K., Kajima, M., Watanabe, T., Bitou, Y., and Takatsuji, T.
- Subjects
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CURVED surfaces , *INDUSTRIAL goods , *CURVATURE , *SAMPLING errors , *MEASUREMENT errors - Abstract
Detailed measurement of the curved surface of an industrial product with a radius of curvature of less than a few millimeters is a challenging task for tactile coordinate measuring machines. To estimate a surface profile, tip radius correction is typically performed by estimating the tip correction vector direction. However, a substantial measurement error is introduced by the error in estimating the tip correction vector direction under measurement conditions such as a large position measurement error of an indicated measured point or a short sampling interval, In this study, a method that can estimate a surface profile by calculating the envelope of a probe tip path was proposed. The proposed method was experimentally and numerically confirmed to be able to estimate surface profiles with sub-micrometer accuracy under such measurement conditions. • A novel method was developed for determining the profile of a surface with a curvature of less than few millimeters using a tactile coordinate measuring machine. • We verified the feasibility of using the proposed method that calculates the envelope of the probe tip path. • The surface profile obtained by the proposed method can be estimated with sub-micrometer accuracy. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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