1. High resolution x-ray diffraction studies of short-period CdTe/MnTe superlattices.
- Author
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de Naurois, M., Stangl, J., Faschinger, W., Bauer, G., and Ferriera, S.
- Subjects
SUPERLATTICES ,X-ray diffraction ,ELASTICITY - Abstract
We have investigated the elastic properties of epitaxial MnTe layers using triple axis high resolution x-ray diffraction and reciprocal space mapping. A series CdTe/MnTe superlattices (SLs) grown by molecular beam epitaxy and nearly strain compensated, were deposited on [001] Cd[sub 1 − x]Zn[sub x]Te substrates. In order to obtain the MnTe content of these SLs without an a priori knowledge of the elastic properties of cubic MnTe, annealing experiments were performed to interdiffuse the individual layers into a mixed Cd[sub 1 − x]Mn[sub x] Te alloy layer. For a precise analysis of the data, it was found to be important to determine the in-plane strain of the superlattice layers using reciprocal space maps around symmetric and asymmetric reciprocal lattice points. The value for the Poisson ratio of zinc-blende MnTe was determined to be v = C[sub 11]/2C[sub 12] = 0.77±0.15. [ABSTRACT FROM AUTHOR]
- Published
- 1997
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