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Herein, we report the thermal transitions and structural properties of poly(3,4-ethylenedioxythiophene/cucurbit[7]uril) pseudopolyrotaxane (PEDOT∙CB7-PS) and polyrotaxane (PEDOT∙CB7-PR) thin films compared with those of pristine PEDOT. The structural characteristics were investigated by using variable-temperature spectroscopic ellipsometry (VTSE), differential scanning calorimetry (DSC), X-ray diffraction (XRD) and atomic force microscopy (AFM). VTSE and DSC results indicated the presence of an endothermic process and glass transition in the PEDOT∙CB7-PS and PEDOT∙CB7-PR thin films. X-ray diffraction of PEDOT∙CB7-PS and PEDOT∙CB7-PR powders displayed the presence of interchain π-π stacking revealing a characteristic arrangement of aromatic rings in the internal structure of the crystallites. AFM imaging of PEDOT∙CB7-PS and PEDOT∙CB7-PR thin films exhibited significant differences in the surface topographies compared with those of PEDOT. A high degree of crystallization was clearly visible on the surface of the PEDOT layer, whereas the PEDOT∙CB7-PS and PEDOT∙CB7-PR thin films exhibited more favorable surface parameters. Such significant differences identified in the surface morphology of the investigated layers can, therefore, be clearly associated with the presence of surrounding CB7 on PEDOT skeletons. [ABSTRACT FROM AUTHOR]

Ellipsometry is widely used to determine the thermo-optical properties of thin polymer films. However, if the thermo-optic coefficient (TOC) and the linear thermal expansion coefficient (LTEC) are to be used to determine the temperature coefficient of electronic polarizability (TCEP) in thin polymer films, their values must be determined with the greatest possible accuracy, as both have the opposite effect. In this article, we analyze changes in ellipsometric parameters resulting from changes in the thin film temperature in order to develop a data analysis method for temperature-dependent spectroscopic ellipsometry that will facilitate the accurate determination of thermo-optical parameters, including the TCEP, in polymer thin films. As practical application examples, we identified optimal spectral windows to accurately determine the thermo-optical parameters of 50 to 150 nm-thick PMMA thin films deposited on Si and SiO2 substrates. The influence of thin-film thickness on the accuracy of TOC and LTEC determination is discussed. [ABSTRACT FROM AUTHOR]

The thermal properties and alignment of crystallinity of materials in thin films play crucial roles in the performance and reliability of various devices, especially in the fields of electronics, materials science, and engineering. The slight variations in the molecular packing of the active layer can make considerable differences in the optical and thermal properties. Herein, we aim to investigate the tuning of the physical properties of a blended thin film of n-type small organic molecules of perylene-3,4,9,10-tetracarboxylic acid (PTCA-SMs) with the mixing of the p-type polymer poly(3-hexylthiophene) (P3HT). The resulting thin films exhibit an enhanced surface crystallinity compared to the pristine material, leading to the formation of long crystallites, and these crystallites are thermally stable in the solid state, as confirmed by X-ray diffraction (XRD), atomic force microscopy (AFM), and thermal analysis using variable-temperature spectroscopic ellipsometry (VTSE) and differential scanning calorimetry (DSC). We believe that the crystalline structure of the obtained P3HT/PTCA-SMs blends is a combination of edge-on and face-on orientations, which enable the potential use of this material as an active layer in organic electronics. [ABSTRACT FROM AUTHOR]

Two combined ellipsometric techniques—variable angle spectroscopic ellipsometry (VASE) and variable temperature spectroscopic ellipsometry (VTSE)—were used as tools to study the surface order and dielectric properties of thin films of a poly(3-hexylthiophene-2,5-diyl) (P3HT) mixture with a fullerene derivative (6,6-phenyl-C71-butyric acid methyl ester) (PC70BM). Under the influence of annealing, a layer of the ordered PC70BM phase was formed on the surface of the blend films. The dielectric function of the ordered PC70BM was determined for the first time and used in the ellipsometric modeling of the physical properties of the P3HT:PC70BM blend films, such as their dielectric function and thickness. The applied ellipsometric optical model of the polymer–fullerene blend treats the components of the blend as a mixture of optically ordered and disordered phases, using the effective medium approximation for this purpose. The results obtained using the constructed model showed that a layer of the ordered PC70BM phase was formed on the surface of the layer of the polymer and fullerene mixture. Namely, as a result of thermal annealing, the thickness of the layer of the ordered fullerene phase increased, while the thickness of the underlying material layer decreased. [ABSTRACT FROM AUTHOR]

Phase diagrams of ternary π-bonded polymer (PTB7-Th) solutions were constructed as a function of molecular weight, temperature, and electron acceptor species (ITIC, PC61BM and PC71BM). For this purpose, the Flory–Huggins lattice theory was employed with a constant χ interaction parameter, describing a binodal, spinodal, tie line, and critical point. Then, the morphologies of the blends composed of highly disordered PTB7-Th and crystallizable ITIC were investigated by atomic force microscopy. Subsequently, the surface polarities of the PTB7-Th:ITIC thin films were examined by water contact-angle goniometer, exhibiting a transition at the composition of ~ 60 ± 10 wt.% ITIC. Furthermore, X-ray diffraction indicated the presence of ITIC's crystallites at ≥ 70 wt.% ITIC. Hence, the PTB7-Th:ITIC system was observed to undergo a phase transition at ~ 60–70 wt.% ITIC. [ABSTRACT FROM AUTHOR]

This work focuses on the study of thermal and physical properties of thin polymer films based on mixtures of semiconductor polymers. The materials selected for research were poly [2,5-bis(2-octyldodecyl)-pyrrolo [3,4-c]pyrrole-1,4(2H,5H)-dione-3,6-diyl)-alt-(2,2′;5′,2″;5″,2′′′-quater-thiophen-5,5′′′-diyl)]—PDPP4T, a p-type semiconducting polymer, and poly(2,5-bis(2-octyldodecyl)-3,6-di(pyridin-2-yl)-pyrrolo [3,4-c]pyrrole-1,4(2H,5H)-dione-alt-2,2′-bithiophene)—PDBPyBT, a high-mobility n-type polymer. The article describes the influence of the mutual participation of materials on the structure, physical properties and thermal transitions of PDPP4T:PDBPyBT blends. Here, for the first time, we demonstrate the phase diagram for PDPP4T:PDBPyBT blend films, constructed on the basis of variable-temperature spectroscopic ellipsometry and differential scanning calorimetry. Both techniques are complementary to each other, and the obtained results overlap to a large extent. Our research shows that these polymers can be mixed in various proportions to form single-phase mixtures with several thermal transitions, three of which with the lowest characteristic temperatures can be identified as glass transitions. In addition, the RMS roughness value of the PDPP4T:PDBPyBT blended films was lower than that of the pure materials. [ABSTRACT FROM AUTHOR]

ABSTRACT: Optical properties of polymer/fullerene blend films upon thermal annealing are investigated by spectroscopic ellipsometry and described consistently within an optical model of the blend film. The optical model developed in this work treats both components, polymer and fullerene, as mixtures of reference materials, that is, their optically ordered and disordered phase. Then, the polymer/fullerene blend layer is also described as a mixture of these two components. In this manner, we extend an existing optical model, which accounts for the optical order within the polymer phases, on cases where the optically ordered PCBM phase occurs, too. Determination of the dielectric functions of all four reference materials allows for a unique quantitative characterization of a polymer/fullerene blend film by assigning to it thickness and the polymer to fullerene volume fraction of its layers as well as corresponding volume fractions of theirs optically ordered and disordered polymer and fullerene phases. © 2018 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2018, 56, 1094–1100 [ABSTRACT FROM AUTHOR]

The aim of this paper is to present the influences of material composition and production conditions of the photovoltaic cells on its parameters as well as the active layer properties. The layers were made of organic compounds: metal phthalocyanine/perylene derivatives. In addition, the effects of TiO2and SiO2nanoadditives were investigated. The materials used are selected so as to allow P–N junction creation. Deposition technique allows at simultaneous applying the materials leads to obtaining homogeneous dispersion of one material in the other, which determines the formation of bulk P–N junctions. Research includes the estimate of share of individual components in the active layer, then determination of the morphology of surface and optical properties of the same layer and its implementation in photovoltaic structures. The structural researches and morphology of surface investigation were made using transmission electron microscopy (TEM), atomic force microscopy (AFM), and scanning electron microscopy (SEM). The optical properties were researched with the use of UV–Visible spectroscope. The parameters of cells have been determined on the basis of current–voltage characteristics. The work undertaken within the framework of article allowed to linking properties of active layers with the parameters of the same cells. [ABSTRACT FROM AUTHOR]

This paper presents some results of investigations on aluminum oxide Al2O3 thin films prepared by the atomic layer deposition method on polished monocrystalline silicon. It has been described how the technological parameters of the deposition process, like the number of cycles and substrate temperature, influenced the optical properties and morphology of prepared thin films. Their physical and optical properties like thickness, uniformity and refractive index have been investigated with spectroscopic ellipsometry, atomic force microscopy and UV/vis optical spectroscopy. [ABSTRACT FROM AUTHOR]

The important research direction in surface engineering and photovoltaics is the development of new materials that can replace the previously used expensive films. A prospective compound is zinc oxide (ZnO), characterized by optical and electrical properties similar to ITO and a lower production cost. One of the key factors influencing the properties of the ZnO thin films is the technique and parameters of their production. The comprehensive investigation results of the influence of ZnO thin-films deposition process temperature on their structure, optical properties, and adhesion are presented in the paper. ZnO films were deposited by the magnetron sputtering method. The structural characteristics of the tested films were investigated by scanning electron microscopy (SEM), atomic force microscopy (AFM), X-ray diffractometry (XRD) and Raman spectroscopy, while the optical properties of the films were studied by the UV/VIS spectroscopy. Thickness and adhesion measurements of the obtained films were performed using the spectroscopic ellipsometry technique and the scratch test, respectively. The obtained research results showed the influence of the deposition process temperature on the morphology, crystallite size and adhesion of the thin films to the substrate. The effect of process temperature on optical properties, the value of the optical bandgap and crystal structures were analyzed and described. The results of this work have a meaning for the development of surface engineering and may serve as a clue in future studies in the field of modern photovoltaic structures. [ABSTRACT FROM AUTHOR]

In this paper, we present research on thermal transition temperature determination in poly (3-hexylthiophene-2,5-diyl) (P3HT), [6,6]-phenyl-C61-butyric acid methyl ester (PC60BM), and their blends, which are materials that are conventionally used in organic optoelectronics. Here, for the first time the results of electrical resistance measurements are explored to detect thermal transitions temperatures, such as glass transition Tg and cold crystallization Tcc of the film. To confirm these results, the variable-temperature spectroscopic ellipsometry studies of the same samples were performed. The thermal transitions temperatures obtained with electrical measurements are well suited to phase diagram, constructed on the basis of ellipsometry in our previous work. The data presented here prove that electrical resistance measurements alone are sufficient for qualitative thermal analysis, which lead to the identification of characteristic temperatures in P3HT:PC60BM films. Based on the carried studies, it can be expected that the determination of thermal transition temperatures by means of electrical resistance measurements will also apply to other semi-conducting polymer films. [ABSTRACT FROM AUTHOR]

The presented study describes the method for the synthesis and characterization of a new class of conjugated copolymers containing a perylenediimide (PDI) and naphthalene diimide (NDI) side groups. The main conjugated backbone is a donor-acceptor polymer poly[3,6-carbazole-alt-5,5-(4′,7′-di-2-thienyl-2′,1′,3′-benzothiadiazole)] containing thiophene and carbazole as donor units and benzothiadiazole as an acceptor unit. The presented compounds were synthesized in a multistep synthesis. The polymerization was carried out by Suzuki or Stille coupling reaction. Redox properties of the studied polymers were tested in different conditions. Electrochemical investigation revealed independent reduction of the main polymer chain and diimide side groups. UV-Vis spectroscopy revealed the overlap of two absorption spectra. The difference between the electron affinity of the polymer main chain and that of the diimides estimated electrochemically is approximately 0.3 eV. [ABSTRACT FROM AUTHOR]