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The real and imaginary parts of the dielectric function of VO2 thin films, deposited on r-plane sapphire via pulsed laser deposition, are measured by means of visible-infrared ellipsometry for wavelengths ranging from 0.4 to 15 μm and temperatures within its phase transition. For both the insulator-to-metal (heating) and metal-to-insulator (cooling) transitions, it is shown that the two ellipsometric signals exhibit three temperature-driven behaviors, which are well described by appropriate combinations of the Tauc-Lorentz, Gaussian, and Drude oscillator models. By fitting Bruggeman's effective medium model for the dielectric function to the corresponding measured experimental values, using the volumetric fraction of the VO2 metallic domains as a fitting parameter for different temperatures within the VO2 phase transition, we have found that this model is suitable for describing the dielectric function in visible and near-infrared wavelengths (∼0.4 to ∼3.0 μm), but it generally fails for longer infrared ones. Furthermore, the hysteresis loop of the VO2 emissivity averaged over a relevant interval of wavelengths is determined and shown to vary from ∼0.49, in the insulator phase, to ∼0.16, in the metallic one. These values, based on the VO2 dielectric function, are consistent with previous measurements reported in the literature, and therefore, our measured data are expected to be useful for describing the behavior of VO2 films involved in optical and radiative applications. [ABSTRACT FROM AUTHOR]

We report on the elaboration and physical properties of fully epitaxial Fe3O4/Al2O3 bilayers to be included in magnetic tunnel junctions. Uncovered Fe3O4(111) single layers and bilayers were epitaxially grown onto sapphire (0001) substrates. Appropriate growth conditions lead to a stoichiometric Fe3O4 layer both at the Fe3O4/Al2O3 interface and on the whole thickness, as checked by in situ x-ray photoelectron spectroscopy and by the observation of the Verwey transition, respectively. Transmission electron microscopy demonstrates the epitaxial growth of a γ-Al2O3 layer on top of Fe3O4(111), which insulating properties have been monitored by conductive tip atomic force microscopy. [ABSTRACT FROM AUTHOR]

Worm-like buckling structures have been investigated by atomic force microscopy to estimate the relevant parameters for the mechanical stability of Y[SUB2]O[SUB3] thin films deposited by ion beam sputtering technique on GaAs substrates. The internal stresses involving in the observed buckling phenomena have been estimated to be around 8.5 GPa in compression. The critical thicknesses up to which the various damaging mechanisms occur have also been determined. [ABSTRACT FROM AUTHOR]

According to Cr content, ternary Al1-xCrxNy films structure evolves from hexagonal to cubic phase. Despite numerous studies on their mechanical properties in relation with the deposition process, the relationship between this phase transition and elastic properties has never been deeply studied. In this paper, the transition has been evidenced by picoseconds ultrasonic and Brillouin light scattering at a chromium concentration of 40 at. % and is characterized by a strong increase of C33 and C44 effective elastic constants (respectively, +83% and +70%). [ABSTRACT FROM AUTHOR]