26 results on '"Pike, G. E."'
Search Results
2. The dc voltage dependence of semiconductor grain-boundary resistance.
3. Electrical properties and conduction mechanisms of Ru-based thick-film (cermet) resistors.
4. Electrical characteristics of metal/Si-Ge contacts.
5. Defect-dipole alignment and tetragonal strain in ferroelectrics.
6. Polarization suppression in Pb(Zr,Ti)O3 thin films.
7. Grain boundary electronic states in some simple ZnO varistors.
8. Electroluminescence in ZnO varistors: Evidence for hole contributions to the breakdown mechanism.
9. Conductivity of thick film (cermet) resistors as a function of metallic particle volume fraction.
10. Identifying composites of famous faces: Investigating memory, language and system issues.
11. Current concentration at defects in ZnO varistor material.
12. Charge trapping in resistance degraded ferroelectrics.
13. Relationships among ferroelectric fatigue, electronic charge trapping, defect-dipoles, and oxygen vacancies in perovskite oxides.
14. Transport in Microscopically Inhomogeneous Materials.
15. Electron tunneling through GaAs grain boundaries.
16. Superconductor Energy Gaps from Tunneling.
17. Hysteresis relaxation in (Pb,La)(Zr,Ti)O3 thin film capacitors with (La,Sr)CoO3 electrodes.
18. Impact ionization near GaAs grain boundaries.
19. Anomalous low-frequency grain-boundary capacitance in silicon.
20. Grain boundary states and varistor behavior in silicon bicrystals.
21. Dislocations and Bubbles in BF+2 Implanted Silicon.
22. A Relationship Between Interatomic Bonding and Electron Transport in Plasma–Deposited, Amorphous Metal Alloys.
23. A Study of Co and Mn in ZnO Varistors.
24. Electronic Properties of ZnO Varistors: A New Model.
25. Comment on 'Conduction mechanisms and temperature dependence of the electroluminescence in ZnO varistors'.
26. Erratum: Grain boundary states and varistor behavior in silicon bicrystals.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.