1. Purification of CdZnTe by electromigration.
- Author
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Kim, K., Sangsu Kim, Jinki Hong, Jinseo Lee, Taekwon Hong, Bolotnikov, A. E., Camarda, G. S., and James, R. B.
- Subjects
ELECTRODIFFUSION ,ELECTRIC fields ,ELECTRON mobility ,ELECTRICAL resistivity ,METAL inclusions - Abstract
Electro-migration of ionized/electrically active impurities in CdZnTe (CZT) was successfully demonstrated at elevated temperature with an electric field of 20 V/mm. Copper, which exists in positively charged states, electro-migrated at a speed of 15 μm/h in an electric field of 20 V/mm. A notable variation in impurity concentration along the growth direction with the segregation tendency of the impurities was observed in an electro-migrated CZT boule. Notably, both Ga and Fe, which exist in positively charged states, exhibited the opposite distribution to that of their segregation tendency in Cd(Zn)Te. A CZT detector fabricated from the middle portion of the electromigrated CZT boule showed an improved mobility-lifetime product of 0.91×10
-2 cm2 /V, compared with that of 1.4×10-3 cm2 /V, observed in an as-grown (non-electro-migrated) CZT detector. The optimum radiation detector material would have minimum concentration of deep traps required for compensation. [ABSTRACT FROM AUTHOR]- Published
- 2015
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