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This study carried out in 2015 and 2016 to determine phenological, pomological and some technological characteristics of 19 seedless mulberry genotypes of the Malatya Apricot Research Institute. Full-bloom periods of the genotypes varied between 27th of April (Poser 24-07) and 3rd of May (24 MRK 02); start of harvest dates varied between 15th of May (Poser 24-07) and 31st of May (Yediveren 24-08); end of harvest dates varied between 5th of July (Angut 009) and 30th of August (Yediveren 24-08). Fruiting durations varied between 50 days (Angut 009) and 95 days (Gemirgap Dutu 24-05). Of the pomological characteristics, average fruit weights varied between 0.77 g (Angut 009) and 2.46 g (Poser 24-07); water soluble dry matter (WSDM) contents varied between 15.50% (Topu Beyaz 1) and 29.60% (Angut 009). Of the technological characteristics, drying efficiency values varied between 15.79% (44 KE 10) and 39.94% (Angut 009), dry fruit color L values varied between 25.97 (Poser 24-07) and 50.20 (İstanbul Dutu 24-12). Based on present findings, Poser 24-07 genotype was found to be prominent with early fruiting and availability for fresh consumption; Yediveren 24-08 genotype with late fruiting; İstanbul Dutu 24-12 genotype with drying efficiency and Gemirgap Dutu 24-05 and Gemirgap Dutu 24-06 genotypes with their longer fruiting durations. Current findings may be beneficial in mulberry breeding programs.

There are a number of satellites working in the harsh space environment. The charged particles in space may strike the electron devices causing the undesired influences, such as soft errors in memory devices or permanent damage in hardware circuits. Aiming at reliability evaluation of very-large-scale integration circuits implemented in SRAM-based field programmable gate arrays, a fault injection platform is constructed based on the soft error mitigation controller in this study. The authors adopt a 16K-point fast Fourier transformation processor as the design under test (DUT) and inject errors into different positions. The effectiveness of this platform is varied by comparing the results of DUT with Golden data. Compared with the traditional reliability testing techniques, the fault injection method proposed in this study has the advantages of low cost, short test period and low resource consumption. Hence, the proposed fault injection design is suitable for circuits consuming huge resources and large number of repeating tests.

The functional and thermal testing of the mobile phone is always performed under various conditions that vary in terms of the connection between the DUT (Device Under Test) and the measuring instrument. To achieve repeatable measurements under such conditions, it is necessary to adjust uplink and downlink loss using the instrument's external attenuation. While for GSM, WCDMA and LTE this is a relatively easy task, CDMA2000 and 1xEV-DO make automation of the adjustment process somewhat challenging due to the nature of the CDMA standard. An especially forward link is more complicated as those tests are run in signaling mode and not all instruments provide an FER value measured by an MS. This paper describes the algorithm for forward link loss adjustment and its implementation using Rohde & Schwarz CMW500.