1. A few-shot image generation method for power defect scenarios
- Author
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HE Yuhao, SONG Yunhai, HE Sen, ZHOU Zhenzhen, SUN Meng, CHEN Yi, and YAN Yunfeng
- Subjects
few-shot image generation ,power defect ,context-aware ,lc-divergence ,Electrical engineering. Electronics. Nuclear engineering ,TK1-9971 - Abstract
Due to the limited availability of power defect data, most current defect detection methods are unable to accurately detect power system anomalies. To overcome this challenge, a few-shot image generation method is employed. Building upon the improved local-fusion generative adversarial network (LoFGAN), a context-aware few-shot image generator is designed to enhance the defect detection network’s capability to extract detailed features. A regularization loss based on LC-divergence is introduced to optimize the training effectiveness of the image generation model on limited datasets. Experimental results reveal that the few-shot image generation method can generate effective and diverse defect data for power scenarios. The proposed model can address the issue of data unavailability in power defect scenarios.
- Published
- 2024
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