1. Particle identification via pulse shape analysis for large-area silicon detectors of the CHIMERA array
- Author
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Alderighi, M., Amorini, F., Anzalone, A., Arena, N., Auditore, L., Bassini, R., Boiano, C., Cardella, G., Cavallaro, S., Chatterjee, M.B., D'Andrea, M., De Filippo, E., Fichera, F., Geraci, E., Giustolisi, F., Guardone, N., Grimaldi, A., Guazzoni, P., La Guidara, E., Lanzano, G., Lanzalone, G., Maiolino, C., Nicotra, D., Pagano, A., Papa, M., Pirrone, S., Politi, G., Porto, F., Pullia, A., Rizzo, F., Russo, S., Russotto, P., Santonocito, D., Sacca, G., Sassi, M., Schroder, W. Udo, Sechi, G.R., Trifiro, A., Toke, J., Trimarchi, M., Urso, S., and Zetta, L.
- Subjects
Silicon diodes -- Design and construction ,Business ,Electronics ,Electronics and electrical industries - Abstract
Mass and atomic-number identification (ID) of reaction products is a fundamental requirement of any nuclear reaction study. An effective particle-ID method is demonstrated, based on pulse shape analysis/discrimination (PSD) applied to large-area, single-element silicon detectors. This technique uses commercial electronic modules and achieves atomic number resolution rivaling that typically obtained with multi-element ([DELTA]E-E) detector telescopes. The method is applied to the CHIMERA detector system without compromising its time-of-flight (TOF) resolution. In-beam tests of the PSD method have been performed with large-area, 300-[micro]m thick CHIMERA silicon detectors, measuring particles from the [sup.19]F + [sup.12]C reaction at Tandem energies. Performance of a simple PSD set up is discussed, for front and rear particle injection. Index Terms--Charge identification, planar silicon detector, pulse shape.
- Published
- 2005