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1. A selective trigger scan architecture for VLSI testing

Author

Hosseinabady, Mohammad, Sharifi, Shervin, Lombardi, Fabrizio, and Navabi, Zainalabedin

Subjects
Embedded system, System on a chip, Integrated circuit fabrication, Embedded systems -- Design and construction, Embedded systems -- Analysis, Very-large-scale integration -- Design and construction, Very-large-scale integration -- Analysis, Integrated circuit fabrication -- Analysis
Published
2008

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