13 results on '"Rodbell, Kenneth P."'
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2. Single-event upsets and multiple-bit upsets on a 45 nm SOI SRAM
3. An evaluation of an ultralow background alpha-particle detector
4. Flip-flop upsets from single-event-transients in 65 nm clock circuits
5. Modeling of alpha-induced single event upsets for 45 nm node SOI devices using realistic C4 and 3D circuit geometries
6. Alpha-particle, carbon-ion and proton-induced flip-flop single-event-upsets in 65 nm bulk technology
7. Low energy proton single-event-upset test results on 65 nm SOI SRAM
8. Low-energy proton-induced single-event-upsets in 65 nm node, silicon-on-insulator, latches and memory cells
9. Importance of BEOL modeling in single event effect analysis
10. Latch design techniques for mitigating single event upsets in 65 nm SOI device technology
11. Single-event-upset critical charge measurements and modeling of 65 nm silicon-on-insulator latches and memory cells
12. Radiation effects in low dielectric constant methyl-silsesquioxane films
13. Open volume defects (measured by positron annihilation spectroscopy) in thin film hydrogen-silsesquioxane spin-on-glass; correlation with dielectric constant
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