8 results on '"Wenliang Zhu"'
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2. Stress dependence of the cathodoluminescence spectrum of N-doped 3C-SiC
3. Determination of in-depth response function using spectral perturbation methods
4. Spatially resolved residual stress assessment of GaN film on sapphire substrate by cathodoluminescence piezospectroscopy
5. Deformation potentials of the direct band gap of n-[Al.sub.0.25][Ga.sub.0.75]As from controlled microscopic stress fields
6. Spatially resolved crack-tip stress analysis in semiconductor by cathodoluminescence piezospectroscopy
7. High-resolution stress assessments of interconnect/dielectric electronic patterns using optically active point defects of silica glass as a stress sensor
8. Stress dependence of the polarized Raman spectrum of polycrystalline lead zirconate titanate
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