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The vibrational energy relaxation rates of the water bend in chloroform and d-chloroform are calculated by using the Landau-Teller formula with a new potential model developed and parametrized for describing the chloroform-water interaction. The studies have shown that the relaxation has involved both the bend and the C-Cl stretches and that the frequency changes of all of the modes upon deuteration has contributed to the solvent isotope effect.

Data from a MOSFET matrix on two JPL CRRES chips, each behind different amounts of shielding, is presented. Space damage factors are nearly identical to ground test values for MOSFETs. The results from neighboring rows of MOSFETs show similar radiation degradation. The SRD (Space Radiation Dosimeter) is used to measure the total dose accumulated by the JPL chips. A parameter extraction algorithm that does not under estimate threshold voltage shifts is used. Temperature effects are removed from the MOSFET data.