1. Low-Power, Subthreshold Reference Circuits for the Space Environment : Evaluated with -rays, X-rays, Protons and Heavy Ions
- Author
-
Andreou, Charalambos M., González-Castaño, Diego Miguel, Gerardin, Simone, Bagatin, Marta, Gómez Rodriguez, Faustino, Paccagnella, Alessandro, Prokofiev, Alexander V., Javanainen, Arto, Virtanen, Ari, Liberali, Valentino, Calligaro, Cristiano, Nahmad, Daniel, Georgiou, Julius, and Georgiou, Julius [0000-0002-7474-5449]
- Subjects
02 engineering and technology ,Hardware_PERFORMANCEANDRELIABILITY ,gammasäteily ,7. Clean energy ,01 natural sciences ,analog single-event transient (ASET) ,Ionization ,single-event effects (SEE) ,0202 electrical engineering, electronic engineering, information engineering ,Annan elektroteknik och elektronik ,Electronic circuit ,Physics ,protons ,Subthreshold conduction ,ionisoiva säteily ,röntgensäteily ,Gamma ray ,gamma-rays ,Hardware and Architecture ,Atomic physics ,Voltage reference ,mikroelektroniikka ,protonit ,Computer Networks and Communications ,lcsh:TK7800-8360 ,voltage reference ,Ion ,heavy-ions ,0103 physical sciences ,ionization ,radiation hardening by design (RHBD) ,X-rays ,Hardware_INTEGRATEDCIRCUITS ,Microelectronics ,Electrical and Electronic Engineering ,hiukkassäteily ,bandgap voltage reference (BGR) ,Other Electrical Engineering, Electronic Engineering, Information Engineering ,010308 nuclear & particles physics ,business.industry ,020208 electrical & electronic engineering ,lcsh:Electronics ,space electronics ,total ionization dose (TID) ,Analog single-event transient (ASET) ,Bandgap voltage reference (BGR) ,CMOS analog integrated circuits ,Gamma-rays ,Heavy-ions ,Protons ,Radiation hardening by design (RHBD) ,Reference circuits ,Single-event effects (SEE) ,Space electronics ,Total ionization dose (TID) ,mikropiirit ,säteilyfysiikka ,Control and Systems Engineering ,reference circuits ,Signal Processing ,business ,Space environment ,Hardware_LOGICDESIGN - Abstract
The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. The assessment is supported by measured results of total ionization dose and single event transient radiation-induced effects under &gamma, rays, X-rays, protons and heavy ions (silicon, krypton and xenon). A high total irradiation dose with different radiation sources was used to evaluate the proposed topologies for a wide range of applications operating in harsh environments similar to the space environment. The proposed custom designed integrated circuits (IC) circuits utilize only CMOS transistors, operating in the subthreshold regime, and poly-silicon resistors without using any external components such as compensation capacitors. The circuits are radiation hardened by design (RHBD) and they were fabricated using TowerJazz Semiconductor&rsquo, s 0.18 &mu, m standard CMOS technology. The proposed voltage references are shown to be suitable for high-precision and low-power space applications. It is demonstrated that radiation hardened microelectronics operating in subthreshold regime are promising candidates for significantly reducing the size and cost of space missions due to reduced energy requirements.
- Published
- 2019