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2. Coplanarity Inspection Method for Integrated Circuit Pins Based on Single Image

Author

Li Shengping, Wu Fupei, and Zhu Shukai

Subjects
Computer science, business.industry, law, Inspection method, Computer vision, Coplanarity, Artificial intelligence, Integrated circuit, Single image, business, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention
Published
2020

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