7 results on '"Franco, Jacopo"'
Search Results
2. Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques
3. Comphy v3.0—A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices
4. A multi-energy level agnostic approach for defect generation during TDDB stress
5. A multi-energy level agnostic simulation approach to defect generation
6. Extensive assessment of the charge-trapping kinetics in InGaAs MOS gate-stacks for the demonstration of improved BTI reliability
7. Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.