17 results on '"Groeseneken, Guido"'
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2. Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes
3. Analysis of slow de-trapping phenomena after a positive gate bias on AlGaN/GaN MIS-HEMTs with in-situ Si3N4/Al2O3 bilayer gate dielectrics
4. Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model
5. Correlation between number of walls and diameter in multiwall carbon nanotubes grown by chemical vapor deposition
6. Modeling the impact of junction angles in tunnel field-effect transistors
7. Integration and electrical characterization of carbon nanotube via interconnects
8. Study of nitrogen impact on VFB–EOT roll-off by varying interfacial SiO 2 thickness
9. Carbon nanotube–carbon nanotube contacts as an alternative towards low resistance horizontal interconnects
10. A consistent model for oxide trap profiling with the Trap Spectroscopy by Charge Injection and Sensing (TSCIS) technique
11. Weibull slope and voltage acceleration of ultra-thin (1.1–1.45 nm EOT) oxynitrides
12. Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing
13. Advanced PBTI reliability with 0.69 nm EOT GdHfO gate dielectric
14. Preface
15. Critical analysis of the substrate hot-hole injection technique
16. Basics and applications of charge pumping in submicron MOSFETs© 1997 IEEE. Reprinted, with permission, from Proc. 1997 21st International Conference on Microelectronics, Nis, Yugoslavia, 14–17 September 1997, Vol. 2, pp. 581–589.
17. The ESD protection mechanisms and the related failure modes and mechanisms observed in SOI snapback nMOSFET's
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