9 results on '"Wagendristel, A."'
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2. Determination of diffusion profiles in thin film couples by means of x-ray-diffraction
3. Recovery of concentration spectra of binary solids from diffraction profiles by means of band matrices
4. Diffraction profiles of thin film diffusion couples
5. Computer simulation of interdiffusion in polycrystalline thin film couples
6. Ultramicrohardness tester for use in a scanning electron microscope
7. Description of grain boundary-supported interdiffusion in thin films by an effective diffusion parameter
8. Ultramicrohardness-tester for thin films
9. An X-ray optical study of layered phase in Au−Al thin film couples
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