1. Influence of test methods on critical current degradation of Bi-2223/Ag superconductor tapes by bending strain
- Author
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Kuroda, Tsuneo, Katagiri, Kazumune, Shin, Hyung-Seop, Itoh, Kikuo, Kumakura, Hiroaki, and Wada, Hitoshi
- Abstract
The results of two test methods were compared among three laboratories to determine a standard measurement method of critical current (Ic) as a function of bending strain for Ag-sheathed Bi-2223 superconductors. The VAMAS round-robin-test method (RRT) and the bending-rig method developed by Goldacker were used. The Icdegradation started with less bending strain for RRT than for bending-rig. Average irreversible strains (?irr) were 0.30% for RRT and 0.37% for bending-rig. Another test identified parameters that affected the results. A modified RRT method, with a current connection between the sample and the electrode, was used to avoid some thermal stresses of the test procedure. The ?irrvalues increased to the level of the bending-rig, but the modified RRT Icdegradation rate with bending strain was higher. The stress states during sample bending differed between these methods. The shear stress was examined as a source of the Icdegradation rate differences with strain in terms of the crack propagation and delamination defects of oxide filaments from the Ag sheath.
- Published
- 2005
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