316 results on '"Grasser, T."'
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2. Process implications on the stability and reliability of 300 mm FAB MoS2 field-effect transistors
3. Reliability Assessment of Double-Gated Wafer-Scale MoS2 Field Effect Transistors through Hysteresis and Bias Temperature Instability Analyses
4. Insulators for Devices Based on 2D Materials
5. Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO2Transistors
6. Design and characterization of the Sandia free-piston reflected shock tunnel
7. A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays
8. Materials and Design study of thermoplastic composite pipes for liquid hydrogen distribution in aviation
9. Impact of Single Defects on NBTI and PBTI Recovery in SiO2 Transistors
10. The Importance of Secondary Generated Carriers in Modeling of Full Bias Space
11. Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors
12. Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS
13. Low-temperature atomic and molecular hydrogen anneals for enhanced chemical $\mathbf{SiO}_{2}$ IL quality in low thermal budget RMG stacks
14. Crystalline insulators for scalable 2D nanoelectronics
15. Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies : Invited paper
16. Multiscale Modeling Study of Native Oxide Growth on a Si(100) Surface
17. Recent Trends in Bias Temperature Instability
18. On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors
19. CV Stretch-Out Correction after Bias Temperature Stress: Work-Function Dependence of Donor-/Acceptor-Like Traps, Fixed Charges, and Fast States
20. Modeling and Simulation Approaches for Drain Current Computation
21. On the Physical Meaning of Single-Value Activation Energies for BTI in Si and SiC MOSFET Devices
22. Atomic Hydrogen Exposure to Enable High-Quality Low-Temperature SiO2 with Excellent pMOS NBTI Reliability Compatible with 3D Sequential Tier Stacking
23. Transport in Nanostructures: A Comparative Analysis Using Monte Carlo Simulation, the Spherical Harmonic Method, and Higher Moments Models
24. Crystalline Calcium Fluoride: A Record-Thin Insulator for Nanoscale 2D Electronics
25. Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures
26. The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release
27. Similarities and Differences of BTI in SiC and Si Power MOSFETs
28. Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures
29. On the impact of mechanical stress on gate oxide trapping
30. First–Principles Parameter–Free Modeling of n– and p–FET Hot–Carrier Degradation
31. Physical Modeling of Bias Temperature Instabilities in SiC MOSFETs
32. Review on SiC MOSFETs High-Voltage Device Reliability Focusing on Threshold Voltage Instability
33. An Efficient Analog Compact NBTI Model for Stress and Recovery Based on Activation Energy Maps
34. Modeling of Lattice Site-Dependent Incomplete Ionization in α-SiC Devices
35. Numerical Simulation and Optimization for 900V 4H-SiC DiMOSFET Fabrication
36. Numerical Analysis of SiC Merged PiN Schottky Diodes
37. The Evolution of the Resistance and Current Density During Electromigration
38. Accurate Modeling of Lattice Site-Dependent Ionization Level of Impurities in α-SiC Devices
39. On the Validity of the Relaxation Time Approximation for Macroscopic Transport Models
40. Advanced Transport Models for Sub-Micrometer Devices
41. Performance Evaluation of Linear Solvers Employed for Semiconductor Device Simulation
42. Investigation of Spurious Velocity Overshoot Using Monte Carlo Data
43. An Impact Ionization Model Including Non-Maxwellian And Non-Parabolicity Effects
44. A Methodology for Deep Sub-Quartermicron CMOS Technology Characterization
45. Boundary Condition Models for Terminal Current Fluctuations
46. TCAD Analysis of Gain Cell Retention Time for SRAM Applications
47. A Physically-Based Electron Mobility Model for Silicon Device Simulation
48. Device Simulator Calibration for Quartermicron CMOS Devices
49. Hydrodynamic Mixed-Mode Simulation
50. Statistical Characterization of BTI and RTN using Integrated pMOS Arrays
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