26 results on '"Ichikawa, Tamotsu"'
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2. 12 bit 1 ps Resolution Time-to-Digital Converter for LSI Test System
3. Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion
4. A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation
5. Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing
6. High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST
7. Evaluation of Code Selective Histogram Algorithm For ADC Linearity Test
8. Metallic Ratio Equivalent-Time Sampling and Application to TDC Linearity Calibration
9. Innovative Practices Track: Innovative Analog Circuit Testing Technologies
10. Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies
11. Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production
12. High Precision Measurement of Sub-Nano Ampere Current in ATE Environment
13. Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies
14. Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer
15. Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method
16. Input Signal and Sampling Frequencies Requirements for Efficient ADC Testing with Histogram Method
17. Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers
18. Accurate Testing of Precision Voltage Reference by DC-AC Conversion
19. Analog/Mixed-Signal Circuit Testing Technologies in IoT Era
20. Consideration on Input Signal for ADC Histogram Test in Short Time
21. High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm
22. Evaluation of Null Method for Operational Amplifier Short-Time Testing
23. Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion
24. Innovative Test Practices in Japan
25. Tetsu-to-Hagane
26. Tetsu-to-Hagane
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