50 results on '"Liu, Fanyu"'
Search Results
2. C-V characterization of the trap-rich layer in a novel Double-BOX structure
3. Swift heavy ion irradiation-driven energy band engineering and its profound influence on the photoresponse of β-Ga2O3 ultraviolet photodetectors
4. Mitigation of Single-Event Upset Sensitivity for 6T SRAM in a 0.18 μm DSOI Technology Considering High LET Heavy Ions Irradiation
5. Impact of Back-Gate Bias and Body-Tie on the DSOI SRAMs Under Total Ionizing Dose Irradiation
6. A New Compact Z$^{\text{2}}$-FET Model Based on Artificial Neural Network and Its Applications
7. A Novel NH3 Sensing Mechanism Based on Au Pads Activated Schottky Barrier MOSFET on Silicon-on-Insulator with Extremely High Sensitivity at Room Temperature
8. Study on the influence mechanism of flue gas desulphurisation gypsum on solid waste-based geopolymer grouting materials
9. C-V Measurement and Modeling of Double-BOX Trap-Rich SOI Substrate
10. Radiation hardness evaluation of ε-Ga2O3 thin-film devices under swift heavy ion irradiation
11. Performance Evaluation of Plastic Optical Fiber Communication Using PAM4 and Computational Temporal Ghost Imaging Algorithm
12. On the Ion Line Calibration by Plasma Line in ISR Measurements
13. The Effects of $\gamma$ Radiation-Induced Trapped Charges on Single Event Transient in DSOI Technology
14. A Compact Artificial Spiking Neuron Using a Sharp-Switching FET With Ultra-Low Energy Consumption Down to 0.45 fJ/Spike
15. The Synergetic Effects of Total Ionizing Dose and High Temperature on 180 nm DSOI Technology
16. Computational temporal ghost imaging algorithm for PAM4-based optical communication systems
17. Enhanced Spatial Light Coupling Efficiency of Polymer Optical Fiber via Micro-lens Self-heating Melting Technique
18. Ultra-High-Energy Heavy Ion Induced Single Event Effect of TSV-Based 3D Integrated SOI SRAM Circuits
19. High Gain Pseudo-Inverter Based on Silicon-on-Insulator With Ambipolar Transport
20. Development of the Sanya Incoherent Scatter Radar and Preliminary Results
21. Novel SOI Based Pseudo-Inverter: Experimental and Simulation Research
22. Single Event Induced Crosstalk of Monolithic 3D Circuits Based on a 22 nm FD-SOI Technology
23. Reliability Improvement on SRAM Physical Unclonable Function (PUF) Using an 8T Cell in 28 nm FDSOI
24. Comparison of Total Ionizing Dose Effects in SOI FinFETs Between Room and High Temperature
25. Extraction of Interface-Trap Densities of the Stacked Bonding Structure in 3D Integration Using High-Frequency Capacitance-Voltage Technique
26. Total Ionizing Dose Radiation Effects Hardening Using Back-gate Bias in Double-SOI Structure
27. A highly sensitive optical fiber temperature sensor based on the enhanced Vernier effect
28. Layout-based mitigation of single-event transient for monolithic 3D CMOS integrated circuits
29. Nano-scaled transistor reliability characterization at nano-second regime
30. Dependence of Temperature and Back-Gate Bias on Single-Event Upset Induced by Heavy Ion in 0.2-μm DSOI CMOS Technology
31. Simulation of Synergetic Radiation Effects for P-type bulk VDMOS
32. Aldo-Keto Reductase 1C3 Mediates Chemotherapy Resistance in Esophageal Adenocarcinoma via ROS Detoxification
33. Method for controlling temperature sensitivity of the fiber intermodal sensor and its application in the torsion sensor
34. Single event upset for monolithic 3-D integrated 6T SRAM based on a 22 nm FD-SOI technology: Effects of channel size and temperature
35. Targeting Glutaminolysis: New Perspectives to Understand Cancer Development and Novel Strategies for Potential Target Therapies
36. A two-dimensional electrostatic potential model for total dose ionization effects in FOI FinFETs
37. Linking Cancer Stem Cell Plasticity to Therapeutic Resistance-Mechanism and Novel Therapeutic Strategies in Esophageal Cancer
38. Design, Synthesis and Biological Evaluation of Pyrano[2,3-b]-naphthoquinone Derivatives as Acetylcholinesterase Inhibitors
39. Radiation-induced Degradation Mechanism in Double-SOI pMOSFETs
40. Back-gate effects and mobility characterization in junctionless transistor
41. TCAD Simulation Study of the Single-Event Effects in Silicon Nanowire Transistors
42. Extraction of the Parasitic Bipolar Gain Using the Back-Gate in Ultrathin FD SOI MOSFETs
43. A simple compact model for carrier distribution and its application in single-, double- and triple-gate junctionless transistors
44. Effect of back gate on parasitic bipolar effect in FD SOI MOSFETs
45. Enhanced coupling effects in vertical double-gate FinFETs
46. (Invited) The Pseudo-MOSFET: Principles and Recent Trends
47. Radiation hardened by design techniques to reduce single event transient pulse width based on the physical mechanism
48. Single event transient pulse attenuation effect in three-transistor inverter chain
49. Modeling to predict the time evolution of negative bias temperature instability (NBTI) induced single event transient pulse broadening
50. The effect of P+ deep well doping on SET pulse propagation
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.