38 results on '"Ma, William Cheng-Yu"'
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2. Ferroelectric Tunnel Thin-Film Transistor for Synaptic Applications
3. Impacts of pulse conditions on endurance behavior of ferroelectric thin-film transistor non-volatile memory
4. Abnormal Degradation Behaviors Under Negative Bias Stress in Flexible p-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors After Laser Lift-Off Process
5. First Demonstration of Ferroelectric Tunnel Thin-Film Transistor Nonvolatile Memory With Polycrystalline-Silicon Channel and HfZrO Gate Dielectric
6. Investigation of Electrical Characteristics in Low-Temperature Polycrystalline Silicon Thin-Film Transistors Fabricated at Low-Temperature Process
7. First Demonstration of Heterogeneous IGZO/Si CFET Monolithic 3-D Integration With Dual Work Function Gate for Ultralow-Power SRAM and RF Applications
8. Demonstration of synaptic characteristics of polycrystalline-silicon ferroelectric thin-film transistor for application of neuromorphic computing
9. Impacts of Independent Dual-Gate Operation on Reliability of Nanosheet Junctionless Thin-Film Transistor
10. Impacts of O2 Plasma on Negative Gate Bias Stress Instability of Tunnel Thin-Film Transistor
11. Impacts of Ammonia Gas Plasma Surface Treatment on Polycrystalline-Silicon Junctionless Thin-Film Transistor
12. Various Reliability Investigations of Low Temperature Polycrystalline Silicon Tunnel Field-Effect Thin-Film Transistor
13. Impacts of Stress Voltage and Channel Length on Hot-Carrier Characteristics of Tunnel Field-Effect Thin-Film Transistor
14. Subthreshold Swing Saturation of Nanoscale MOSFETs Due to Source-to-Drain Tunneling at Cryogenic Temperatures
15. Gate capacitance effect on P-type tunnel thin-film transistor with TiN/HfZrO2 gate stack
16. Impacts of Vertically Stacked Monolithic 3D-IC Process on Characteristics of Underlying Thin-Film Transistor
17. Temperature dependence improvement of polycrystalline-silicon tunnel field-effect thin-film transistor
18. Impacts of channel film thickness on poly-Si tunnel thin-film transistors
19. Dependence of Sub-Thermionic Swing on Channel Thickness and Drain Bias of Poly-Si Junctionless Thin-Film Transistor
20. Impacts of Trap-State Generation on Tunnel Thin-Film Transistor
21. Positive bias temperature instability of tunnel thin-film transistor for applications of system-on-panel and three-dimension integrated circuits
22. Current Degradation by Carrier Recombination in a Poly-Si TFET With Gate-Drain Underlapping
23. Plasma-Induced Interfacial Layer Impacts on TFETs With Poly-Si Channel Film by Oxygen Plasma Surface Treatment
24. Positive-Bias Temperature Instability Improvement of Poly-Si Thin-Film Transistor With HfO2 Gate Dielectric by Ammonia Plasma Treatment
25. Performance improvement of poly-Si tunnel thin-film transistor by NH3 plasma treatment
26. Performance Improvement of Poly-Si Tunnel FETs by Trap Density Reduction
27. Bias temperature instability comparison of CMOS LTPS-TFTs with HfO2 gate dielectric
28. Impact of Crystallization Method on Poly-Si Tunnel FETs
29. Threshold Voltage Reduction and Mobility Improvement of LTPS-TFTs With NH3 Plasma Treatment
30. Reverse Electrical Behavior of N-Channel and P-Channel LTPS-TFTs by N2O Plasma Surface Treatment
31. Distinction between interfacial layer effect and trap passivation effect of N2 plasma treatment on LTPS-TFTs
32. Asymmetric Driving Current Modification of CMOS LTPS-TFTs With ${\rm HfO}_{2}$ Gate Dielectric
33. Oxide Thinning and Structure Scaling Down Effect of Low-Temperature Poly-Si Thin-Film Transistors
34. The Lanthanum oxide capping layer induced flat-band roll-off behaviors in high-κ/metal-gate NMOSFETs with 28nm CMOS technology
35. Channel Film Thickness Effect of Low-Temperature Polycrystalline-Silicon Thin-Film Transistors
36. A Novel p-n-Diode Structure of SONOS-Type TFT NVM With Embedded Silicon Nanocrystals
37. Low temperature Ni-nanocrystals-assisted hybrid polycrystalline silicon thin film transistor for non-volatile memory applications
38. Low-Temperature Polycrystalline Silicon Thin Film Transistor Nonvolatile Memory Using Ni Nanocrystals as Charge-Trapping Centers Fabricated by Hydrogen Plasma Process
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