16 results on '"Smedes, T."'
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2. Effect of Velocity Saturation on Small Signal Behaviour of Submicron MOSFETs: Analytical Modelling and 2-D Simulations
3. Pitfalls for CDM calibration procedures
4. ESD testing of devices, ICs and systems
5. Harmful voltage overshoots due to turn-on behaviour of ESD protections during fast transients
6. Selecting an appropriate ESD protection for discrete RF power LDMOSTs
7. The application of transmission line pulse testing for the ESD analysis of integrated circuits
8. An analytical model for the Non-Quasi-Static small-signal behaviour of submicron MOSFETs
9. Influence of channel series resistances on dynamic MOSFET behaviour
10. Boundary element methods for 3D capacitance and substrate resistance calculations in inhomogeneous media in a VLSI layout verification package
11. A new description of dual γ-factor threshold voltage with continuous second-order derivative
12. Extraction of circuit models for substrate cross-talk
13. Significance of including substrate capacitance in the full chip circuit model of ICs under CDM stress
14. Effects of the lightly doped drain configuration on capacitance characteristics of submicron MOSFETs
15. Statistical modeling and circuit simulation for design for manufacturing
16. Practical modeling of the effects of processing fluctuations on circuit behaviour
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