66 results on '"Wagendristel, A."'
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2. Messungen der Dichte dünner Aufdampfschichten
3. Messungen der Dichte dünner Aufdampfschichten
4. An Introduction to Physics and Technology of Thin Films
5. X-ray studies of TiN coatings
6. Variation of the lead content in sputtered copper–lead films due to resputtering effects
7. Influence of elastic recovery on microindentation hardness —a finite element analysis
8. Ultra-Microhardness Testing and Mechanical Properties of Ceramic Optical Thin Films
9. Finite element study on indentations into TiN- and multiple TiN/Ti layers on steel
10. Post magnetron sputtering of alloys onto inner surfaces of cylindrical substrates
11. Oriented growth of Al 20 wt% Sn films sputtered from a cylindrical post magnetron
12. A finite element study of the penetration of an indenter into coated systems
13. Excitation of plasmons by fast electrons in thin amorphous and crystalline AgCu films
14. Analyse der Gestaltänderung von Aluminiumpulverpartikeln während eines Naßmahlvorganges / Analysis of Shape Alterations of Aluminium Powder Particles during a Wet-Milling Process
15. Ultramicrohardness investigations of single crystals in a scanning electron microscope and X-ray topography of the deformation zone
16. An X-ray Optical Method for the Determination of Diffusion Properties in Very Thin Bimetallic Films
17. Recovery of concentration spectra of binary solids from diffraction profiles by means of band matrices
18. Hardness Measurements in a SEM as a Quality Test for Thin Films
19. The Influence of Grain Boundary Migration on the Diffusion Behaviour of Thin Films
20. Diffusional alloying in polycrystalline AgAl thin film couples studied by means of Kiessig X-ray interference
21. Ultralow‐load hardness tester for use in a scanning electron microscope
22. Ultramicrohardness measurements of coated samples
23. Influence of the grain-boundary structure on the rate of mixing in thin polycrystalline films
24. Röntgenographische Bestimmung der Konzentrationsverteilung inhomogener Legierungen
25. Über die Temperaturabhängigkeit der Dichte von dünnen Kupferaufdampfschichten / On the Temperature Dependence of the Density of thin Vacuum Deposited Copper Films
26. Ultralow load hardness testing of coatings in a scanning electron microscope
27. MAGNETIC PROPERTIES OF FLASH EVAPORATED AMORPHOUS (Nd, Fe) FILMS
28. Some Remarks on the Evaluation of Concentration Spectra in Solids From X-Ray Diffraction Profiles
29. Amorphous CuAg Films with High Stability
30. An x-ray optical study of layered phase growth in Au-Al thin film couples
31. An X-ray optical study of layered phase in Au−Al thin film couples
32. Determination of diffusion profiles in thin film couples by means of x-ray-diffraction
33. Diffraction profiles of thin film diffusion couples
34. Electron microscope observations of interdiffusion and ordering in copper-gold thin film diffusion couples
35. Ultramicrohardness measurements on aluminium films evaporated under various conditions
36. Description of grain boundary-supported interdiffusion in thin films by an effective diffusion parameter
37. Ultra-microhardness Testing of Optical Coatings
38. Evaluation of diffusion parameters in thin film diffusion couples by means of kiessig X-ray interferences
39. Atomic diffusion and structural relaxation in amorphous CuAg thin films
40. Ultramicrohardness tester for use in a scanning electron microscope
41. The Influence of the Grain Shape on X-Ray Line Broadening
42. Numerical simulation of diffusion in polycrystalline thin film couples during recrystallization
43. Low temperature diffusion in thin-film couples of polycristalline silver and gold
44. DETERMINATION OF THE GROWTH RATES OF Au2Al DIFFUSIONALLY FORMED IN THIN STEP-SHAPED Au-Al COUPLES
45. Electrical resistivity and electron energy loss spectra of amorphous and crystalline thin Cu-Ag films
46. Computer simulation of interdiffusion in polycrystalline thin film couples
47. Mechanical Properties Of Coatings Revealed By Ultra Low Load (VICKERS) Hardness Measurements In A SEM
48. Resistometric Evidence of Diffusional Mixing in Concentration Layered Amorphous AgCu Films
49. X-Ray Diffraction Profiles of Inhomogeneous Binary Solids
50. Ultramicrohardness-tester for thin films
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