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We present a general theory of current deviations in straight current carrying wires with random imperfections, which quantitatively explains the recent observations of organized patterns of magnetic field corrugations above micron-scale evaporated wires. These patterns originate from the most efficient electron scattering by Fourier components of the wire imperfections with wavefronts along the $\pm 45^{\circ}$ direction. We show that long range effects of surface or bulk corrugations are suppressed for narrow wires or wires having an electrically anisotropic resistivity.

Ultracold atom magnetic field microscopy enables the probing of current flow patterns in planar structures with unprecedented sensitivity. In polycrystalline metal (gold) films we observe long-range correlations forming organized patterns oriented at +/- 45 deg relative to the mean current flow, even at room temperature and at length scales orders of magnitude larger than the diffusion length or the grain size. The preference to form patterns at these angles is a direct consequence of universal scattering properties at defects. The observed amplitude of the current direction fluctuations scales inversely to that expected from the relative thickness variations, the grain size and the defect concentration, all determined independently by standard methods. This indicates that ultracold atom magnetometry enables new insight into the interplay between disorder and transport.

We show that previously observed large disorder potentials in magnetic microtraps for neutral atoms are reduced by about two orders of magnitude when using atom chips with lithographically fabricated high quality gold layers. Using one dimensional Bose-Einstein condensates, we probe the remaining magnetic field variations at surface distances down to a few microns. Measurements on a 100 um wide wire imply that residual variations of the current flow result from local properties of the wire., Comment: submitted on September 24th, 2004