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Data recovery has long been a focus of the electronics industry for decades by security experts, focusing on hard disk recovery, a type of non-volatile memory. Unfortunately, none of the existing research, neither from academia, industry, or government, have ever considered data recovery from volatile memories. The data is lost when it is powered off, by definition. To the best of our knowledge, we are the first to present an approach to recovering data from a static random access memory. It is conventional wisdom that SRAM loses its contents whenever it turns off, and it is not required to protect sensitive information, e.g., the firmware code, secret encryption keys, etc., when an SRAM-based computing system retires. Unfortunately, the recycling of integrated circuits poses a severe threat to the protection of intellectual properties. In this paper, we present a novel concept to retrieve SRAM data as aging leads to a power-up state with an imprint of the stored values. We show that our proposed approaches can partially recover the previously used SRAM content. The accuracy of the recovered data can be further increased by incorporating multiple SRAM chips compared to a single one. It is impossible to retrieve the prior content of some stable SRAM cells, where aging shifts these cells towards stability. As the locations of these cells vary from chip to chip due to uncontrollable process variation, the same cell has a higher chance of being unstable or stable against aging in any of the chips, which helps us recover the content. Finally, majority voting is used to combine a set of SRAM chips' data to recover the stored data. We present our experimental result using commercial off-the-shelf SRAMs with stored binary image data before performing accelerated aging. We demonstrate the successful partial retrieval on SRAMs that are aged with as little as 4 hours of accelerated aging with 85C.

Due to the adoption of horizontal business models following the globalization of semiconductor manufacturing, the overproduction of integrated circuits (ICs) and the piracy of intellectual properties (IPs) can lead to significant damage to the integrity of the semiconductor supply chain. Logic locking emerges as a primary design-for-security measure to counter these threats, where ICs become fully functional only when unlocked with a secret key. However, Boolean satisfiability-based attacks have rendered most locking schemes ineffective. This gives rise to numerous defenses and new locking methods to achieve SAT resiliency. This paper provides a unique perspective on the SAT attack efficiency based on conjunctive normal form (CNF) stored in SAT solver. First, we show how the attack learns new relations between keys in every iteration using distinguishing input patterns and the corresponding oracle responses. The input-output pairs result in new CNF clauses of unknown keys to be appended to the SAT solver, which leads to an exponential reduction in incorrect key values. Second, we demonstrate that the SAT attack can break any locking scheme within linear iteration complexity of key size. Moreover, we show how key constraints on point functions affect the SAT attack complexity. We explain why proper key constraint on AntiSAT reduces the complexity effectively to constant 1. The same constraint helps the breaking of CAS-Lock down to linear iteration complexity. Our analysis provides a new perspective on the capabilities of SAT attack against multiplier benchmark c6288, and we provide new directions to achieve SAT resiliency.

The outsourcing of the design and manufacturing of integrated circuits has raised severe concerns about the piracy of Intellectual Properties and illegal overproduction. Logic locking has emerged as an obfuscation technique to protect outsourced chip designs, where the circuit netlist is locked and can only be functional once a secure key is programmed. However, Boolean Satisfiability-based attacks have shown to break logic locking, simultaneously motivating researchers to develop more secure countermeasures. In this paper, we present a novel fault injection attack to break any locking technique that relies on a stored secret key, and denote this attack as AFIA, ATPG-guided Fault Injection Attack. The proposed attack is based on sensitizing a key bit to the primary output while injecting faults at a few other key lines that block the propagation of the targeted key bit. AIFA is very effective in determining a key bit as there exists a stuck-at fault pattern that detects a stuck-at 1 (or stuck-at 0) fault at any key line. The average complexity of number of injected faults for AFIA is linear with the key size and requires only |K| test patterns to determine a secret key, K. AFIA requires a fewer number of injected faults to sensitize a bit to the primary output, compared to 2|K|-1 faults for the differential fault analysis attack [26]., Comment: arXiv admin note: text overlap with arXiv:2007.10512

The need for reducing manufacturing defect escape in today's safety-critical applications requires increased fault coverage. However, generating a test set using commercial automatic test pattern generation (ATPG) tools that lead to zero-defect escape is still an open problem. It is challenging to detect all stuck-at faults to reach 100% fault coverage. In parallel, the hardware security community has been actively involved in developing solutions for logic locking to prevent IP piracy. Locks (e.g., XOR gates) are inserted in different locations of the netlist so that an adversary cannot determine the secret key. Unfortunately, the Boolean satisfiability (SAT) based attack, introduced in [1], can break different logic locking schemes in minutes. In this paper, we propose a novel test pattern generation approach using the powerful SAT attack on logic locking. A stuck-at fault is modeled as a locked gate with a secret key. Our modeling of stuck-at faults preserves the property of fault activation and propagation. We show that the input pattern that determines the key is a test for the stuck-at fault. We propose two different approaches for test pattern generation. First, a single stuck-at fault is targeted, and a corresponding locked circuit with one key bit is created. This approach generates one test pattern per fault. Second, we consider a group of faults and convert the circuit to its locked version with multiple key bits. The inputs obtained from the SAT tool are the test set for detecting this group of faults. Our approach is able to find test patterns for hard-to-detect faults that were previously failed in commercial ATPG tools. The proposed test pattern generation approach can efficiently detect redundant faults present in a circuit. We demonstrate the effectiveness of the approach on ITC'99 benchmarks. The results show that we can achieve a perfect fault coverage reaching 100%., Comment: 12 pages, 7 figures, 5 tables