55 results on '"Masahiro Ishida"'
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2. A Jitter Injection Module for Production Test of 52-Gbps PAM4 Signal Interfaces.
3. A Stressed Eye Testing Module for Production Test of 30-Gbps NRZ Signal Interfaces.
4. A jitter separation and BER estimation method for asymmetric total jitter distributions.
5. Digitally-Controlled Compensation Current Injection to ATE Power Supply for Emulation of Customer Environment.
6. Power supply impedance emulation to eliminate overkills and underkills due to the impedance difference between ATE and customer board.
7. An Optical Interconnection Test Method Applicable to 100-Gb/s Transceivers Using an ATE Based Hardware.
8. An ATE system for testing 2.4-GHz RF digital communication devices with QAM signal interfaces.
9. A new method for measuring alias-free aperture jitter in an ADC output.
10. A Technique for Analyzing On-Chip Power Supply Impedance.
11. An ATE System for Testing RF Digital Communication Devices With QAM Signal Interfaces.
12. Power Supply Voltage Control for Eliminating Overkills and Underkills in Delay Fault Testing.
13. Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing.
14. Statistical silicon results of dynamic power integrity control of ATE for eliminating overkills and underkills.
15. An ATE Based 32 Gbaud PAM-4 At-Speed Characterization and Testing Solution.
16. A functional test of 2-GHz/4-GHz RF digital communication device using digital tester.
17. Real-time testing method for 16 Gbps 4-PAM signal interface.
18. Power integrity control of ATE for emulating power supply fluctuations on customer environment.
19. Post-Silicon Jitter Measurements.
20. Marker based camera pose estimation for underwater robots.
21. Real-time testing method for 16 Gbps 4-PAM signal interface.
22. A robust method for identifying a deterministic jitter model in a total jitter distribution.
23. A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing.
24. An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time.
25. Data jitter measurement using a delta-time-to-voltage converter method.
26. An On-Chip Delta-Time-to-Voltage Converter for Real-Time Measurement of Clock Jitter.
27. Mismatch-Tolerant Circuit for On-Chip Measurements of Data Jitter.
28. A Study of Per-Pin Timing Jitter Scope.
29. A Real-Time Delta-Time-to-Voltage Converter for Clock Jitter Measurement.
30. Extension of power supply impedance emulation method on ATE for multiple power domain.
31. A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems.
32. Effects of Deterministic Jitter in a Cable on Jitter Tolerance Measurements.
33. A New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter.
34. Effects of Amplitude Modulation in Jitter Tolerance Measurements of Communication Devices.
35. Timing Jitter Measurement of 10 Gbps Bit Clock Signals Using Frequency Division.
36. Testing clock distribution circuits using an analytic signal method.
37. A Method for Measuring the Cycle-to-Cycle Period Jitter of High-Frequency Clock Signals.
38. Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost.
39. Jitter measurements of a PowerPCTM microprocessor using an analytic signal method.
40. Extraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method.
41. A fully integrated GaN-based power IC including gate drivers for high-efficiency DC-DC Converters.
42. COMPACT: A Hybrid Method for Compressing Test Data.
43. An Efficient Method for Compressing Test Data.
44. Innovative practices session 10B innovative practices in Asia-2: From cost perspective.
45. Innovative practices session 9B innovative practices in Asia-1: From quality perspective.
46. Skew measurements in clock distribution circuits using an analytic signal method.
47. Extraction of instantaneous and RMS sinusoidal jitter using an analytic signal method.
48. Timing Jitter Measurement of Intrinsic Random Jitter and Sinusoidal Jitter Using Frequency Division.
49. A Method for Compressing Test Data Based on Burrows-Wheeler Transformation.
50. Programming for Parallel Pattern Generators.
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