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Your search keyword '"O'Keefe, M.A."' showing total 27 results
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27 results on '"O'Keefe, M.A."'

3. Atomic structure of defects in GaN:Mg grown with Ga polarity

Author

Liliental-Weber, Z., Tomaszewicz, T., Zakharov, D., Jasinski, J., O'Keefe, M.A., Hautakangas, S., Laakso, A., and Saarinen, K.

Subjects
Condensed matter physics, superconductivity and superfluidity, Condensed matter physics, superconductivity and superfluidity
Published
2003

5. Seeing atoms only 0.78A apart

Author

O'Keefe, M.A. and Nelson, E.C.

Subjects
Materials science, sub-Angstrom silicon atomic-resolution
Abstract

The one-Angstrom microscope (OAM) project at the USDOE's National Center for Electron Microscopy has extended the limits of high-resolution transmission electron microscopy to sub-Angstrom levels. The OAM combines image-processing software with a modified 300keV electron microscope equipped with a highly-coherent field-emission electron gun. We have found that a reduction in the OAM's electron-gun extraction voltage allows us to "see" silicon atoms separated by only 0.78A.

Published
2001

6. Installing and operating FEGTEMs

Author

Hetherington, C.J., Cullis, A.G., Walker, S., Turner, J., Nelson, E.C., and O'Keefe, M.A.

Abstract

In order to operate at full potential, Field-Emission-Gun Transmission Electron Microscopes (FEG-TEMs) require special environments designed to minimize the effects of vibration and electromagnetic noise. This report shows how careful attention to these details can enable such instruments to achieve their design parameters and produce information transfer to sub-Angstrom resolutions.

Published
1997

7. Automation for on-line remote-control in-situ electron microscopy

Author

O'Keefe, M.A., Parvin, B., Owen, D., Taylor, J., Westmacott, K.H., Johnston, W., and Dahmen, U.

Subjects
Instrumentation -- other, Materials science, Telemicroscopy on-line remote control teleoperation collaboratory in situ HVEM Internet
Abstract

We have developed and tested a multimedia system for remote operation of transmission electron microscopes and used it to control the Kratos 1500keV microscope in Berkeley during in-situ experiments.

Published
1996

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