Author: "Akella R" / Journal: 1997 ieee/semi advanced semiconductor manufacturing conference and workshop asmc 97 proceedings - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Akella R"' showing total 3 results

Start Over Author "Akella R" Journal 1997 ieee/semi advanced semiconductor manufacturing conference and workshop asmc 97 proceedings

3 results on '"Akella R"'

1. Valuation of yield management investments

Author: Wang, E., primary, Holtan, M., additional, Akella, R., additional, Emami, I., additional, McIntyre, M., additional, Jensen, D., additional, and Fletcher, D., additional
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2. Effective excursion detection and source isolation with defect inspection and classification

Author: Shindo, W., primary, Wang, E.H., additional, Akella, R., additional, and Strojwas, A.J., additional
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3. Effective in-line defect monitoring with variable wafer area coverage

Author: Kuo, W.W., primary, Akella, R., additional, and Fletcher, D., additional
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