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This paper reports an innovative source and load-pull measurement system suitable for power transistor characterization using complex modulated signals. The main originality of the proposed system is the use of active branches driven by a single RF and baseband coherent multi-harmonic vector signal generator. One broadband six-port reflectometer is used as a homodyne vector network analyzer to measure the impedances at the fundamental and harmonic frequencies at the device under test output terminal. To demonstrate the capabilities of the measurement system, source-pull and load-pull measurements are performed on a medium power FET to optimize its efficiency.