5 results on '"Grasser, T."'
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2. Analysis of the threshold voltage turn-around effect in high-voltage n-MOSFETs due to hot-carrier stress
3. Impact of single charged gate oxide defects on the performance and scaling of nanoscaled FETs
4. The relevance of deeply-scaled FET threshold voltage shifts for operation lifetimes
5. Correlation of single trapping and detrapping effects in drain and gate currents of nanoscaled nFETs and pFETs
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