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Start Over Author "Travis Eiles" Journal 2013 ieee international reliability physics symposium (irps)
1 results on '"Travis Eiles"'

1. Self-heat reliability considerations on Intel's 22nm Tri-Gate technology

Author

Ian R. Post, Kaizad Mistry, P. Vandervoorn, Chetan Prasad, A. Schmitz, Paul A. Packan, Dhruv Singh, B. Niu, M. Agostinelli, Daniel Pantuso, P. Bai, S. Ramey, Sanjay Natarajan, Travis Eiles, J. Thomas, Sell Bernhard, J. Hicks, Lei Jiang, C. Auth, Chia-Hong Jan, S. Suthram, and Curtis Tsai

Subjects
Engineering, Matching (statistics), Reliability (semiconductor), Process (engineering), business.industry, law, Transistor, Electronic engineering, business, law.invention
Abstract

This paper describes various measurements on self-heat performed on Intel's 22nm process technology, and outlines its reliability implications. Comparisons to thermal modeling results and analytical data show excellent matching.

Published
2013
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