Author: "Waltl, M." / Journal: 2016 ieee international reliability physics symposium (irps) - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Waltl, M."' showing total 3 results

Start Over Author "Waltl, M." Journal 2016 ieee international reliability physics symposium (irps)

3 results on '"Waltl, M."'

1. The “permanent” component of NBTI revisited: Saturation, degradation-reversal, and annealing

Author: Grasser, T., primary, Waltl, M., additional, Rzepa, G., additional, Goes, W., additional, Wimmer, Y., additional, El-Sayed, A.-M., additional, Shluger, A. L., additional, Reisinger, H., additional, and Kaczer, B., additional
Published: 2016
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2. Reliability of single-layer MoS2 field-effect transistors with SiO2 and hBN gate insulators

Author: Illarionov, Yu. Yu., primary, Waltl, M., additional, Furchi, M. M., additional, Mueller, T., additional, and Grasser, T., additional
Published: 2016
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3. Nanoscale evidence for the superior reliability of SiGe high-k pMOSFETs

Author: Waltl, M., primary, Grill, A., additional, Rzepa, G., additional, Goes, W., additional, Franco, J., additional, Kaczer, B., additional, Mitard, J., additional, and Grasser, T., additional
Published: 2016
Full Text: View/download PDF

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