6 results on '"Hua, Mengyuan"'
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2. Effects of Substrate Termination on Reverse-bias Stress Reliability of Normally-off Lateral GaN-on-Si MIS-FETs
3. Charge-Modulated Schottky Barrier Lowering Effect in GaN Double-Channel Lateral Power SBDs with Gated Anode
4. Temperature-Dependent Gate Degradation of $p$-GaN Gate HEMTs under Static and Dynamic Positive Gate Stress
5. Characterization of Dynamic $I_{\text{OFF}}$ in Schottky-Type $p$-GaN Gate HEMTs
6. Identifying the Location of Hole-Induced Gate Degradation in $\text{LPCVD} -\text{SiN}_{x}/\text{GaN}$ MIS-FETs under High Reverse-Bias Stress
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