Author: "Wu, Wangran" / Journal: 2019 ieee 26th international symposium on physical and failure analysis of integrated circuits (ipfa) - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Wu, Wangran"' showing total 3 results

Start Over Author "Wu, Wangran" Journal 2019 ieee 26th international symposium on physical and failure analysis of integrated circuits (ipfa)

3 results on '"Wu, Wangran"'

1. Repetitive-avalanche-induced Electrical Degradation and Optimization for 1.2kV 4H-SiC MOSFETs

Author: Fu, Hao, primary, Wei, Jiaxing, additional, Liu, Siyang, additional, Wu, Wangran, additional, and Sun, Weifeng, additional
Published: 2019
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2. Electrical Performances and Physics Based Analysis of 650V E-mode GaN Devices at High Temperatures

Author: Zhang, Chi, primary, Li, Sheng, additional, Liu, Siyang, additional, Wei, Jiaxing, additional, Wu, Wangran, additional, and Sun, Weifeng, additional
Published: 2019
Full Text: View/download PDF

3. Electrical Degradations of p-GaN HEMT under High Off-state Bias Stress with Negative Gate Voltage

Author: Zhang, Chi, primary, Li, Sheng, additional, Liu, Siyang, additional, Wei, Jiaxing, additional, Wu, Wangran, additional, and Sun, Weifeng, additional
Published: 2019
Full Text: View/download PDF

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