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Your search keyword '"Dinnebier, Robert E."' showing total 17 results

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17 results on '"Dinnebier, Robert E."'

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1. Crystal structures of calcium hemicarboaluminate and carbonated calcium hemicarboaluminate from synchrotron powder diffraction data.

2. A time-resolved powder diffraction study of in-situ photodimerization kinetics of 9-methylanthracene using a CCD area detector and parametric Rietveld refinement.

3. Form, function and functionality of two dimeric toluene-2,4-diisocyanate polymorphs.

4. Structure of a new high-pressure-high-temperature modification of antimony(III) oxide, γ-Sb2O3, from high-resolution synchrotron powder diffraction data.

5. CaSeO4-O.625H2O - water channel occupation in a bassanite related structure.

6. Maximum entropy method and charge flipping, a powerful combination to visualize the true nature of structural disorder from in situ X-ray powder diffraction data.

7. SiBr4 - prediction and determination of crystal structures.

8. Structure determination of Mg3(OH)5Cl·4H2O (F5 phase) from laboratory powder diffraction data and its impact on the analysis of problematic magnesia floors.

9. Structures of three dehydration products of bischofite from in situ synchrotron powder diffraction data (MgCl2· nH2O; n = 1, 2, 4).

10. Determination of the structure of the violet pigment C22H12Cl2N6O4 from a non-indexed X-ray powder diagram.

11. Influence of the molecular structures on the high-pressure and low-temperature phase transitions of plastic crystals.

12. Structure of compounds E(SnMe3)4 (E = Si, Ge) as seen by high-resolution X-ray powder diffraction and solid-state NMR.

13. Disordered crystal structure of pentamethylcyclopentadienylsodium as seen by high-resolution X-ray powder diffraction.

14. Bulk modulus and non-uniform compression of Nb[sub 3]Te[sub 4] and In[sub x]Nb[sub 3]Te[sub 4] (x < 1) channel compounds.

15. Bulk modulus and high-pressure crystal structures of tetrakis(trimethylsiiyl)methane C[Si(CH3)3]4 determined by X-ray powder diffraction.

16. Order-disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis (trimethylsilyl)methane C[Si(CH[sub3])[sub3]][sub4] and tetrakis (trimethylsilyl)silane Si[Si(CH[sub3])[sub3]][sub4].

17. Disorder determined by high-resolution powder diffraction: structure of pentamethylcyclopentadienyllithium.

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