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Abstract: Thin, biaxially textured Ni5W/Ni12W/Ni5W composite substrates for coated conductor applications have been fabricated. The particularity of this three-layer composite configuration resides in the elemental diffusion between the outer layer and the core layer. Due to the migration of elemental W, the diffusion layer in the as-annealed substrate becomes broader than that of the as-rolled substrate. The obtained tape has a sharp cubic texture on the Ni5W outer layers, and the volume fraction of cubic grains exceeds 98.8% (<10°) at the outer surfaces. In situ electron backscatter diffraction strain–stress analysis shows that the high-quality cubic texture was stable until elongations as high as 2%. The yield strength of the composite substrate approaches 240MPa and its saturation magnetization at 77K has been strongly reduced with respect to pure Ni and Ni5W substrates. The present results demonstrate that this advanced three-layer substrate is suitable for the epitaxial growth of the LZO buffer layers. [Copyright &y& Elsevier]